Evanescent field excitation and measurement of dye fluorescence in a metallic probe near-field scanning optical microscope

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 472-476

  Hayazawa, N ^a   Inouye, Y ^a   Kawata, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Fluorescence; High NA; Metallic probe; TIR

Indexed keywords

DIFFRACTION; EVANESCENT FIELDS; FLUORESCENCE; MICROSCOPES; OPTICAL INSTRUMENT LENSES; OPTICAL SYSTEMS;

FIELD EXCITATIONS; FIELD MEASUREMENT; FLUORESCENCE EXCITATION; HIGH NUMERICAL APERTURES; MEASUREMENTS OF; METALLIC PROBE; METALLICS; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; NUMERICAL APERTURE; TIR;

PROBES;

FLUORESCENT DYE; METAL;

CONFERENCE PAPER; DIFFRACTION; FIBER OPTICS; FLUORESCENCE; ILLUMINATION; LENS POWER; LIGHT SCATTERING; MEASUREMENT; MICROSCOPE IMAGE; PRIORITY JOURNAL; REFLECTOMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0033032860     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00563.x     Document Type: Conference Paper

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