The role of tip plasmons in near-field Raman microscopy

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 66-71

  Milner, R G ^a   Richards, D ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

Plasmon; Raman microscopy; Raman scattering; SERS; SNOM; Tip enhancement

Indexed keywords

ELECTRIC EXCITATION; ELECTRIC FIELDS; FINITE DIFFERENCE TIME DOMAIN METHOD; SUBSTRATES;

BULK-MODE; ELECTRIC FIELD STRENGTH; METAL TIP; NEAR-FIELD RAMAN MICROSCOPY; NORMAL INCIDENCE; PLASMA MODE; RAMAN MICROSCOPY; SCANNING NEAR FIELD; SERS; TIP ENHANCEMENT;

PLASMONS;

CONFERENCE PAPER; EXCITATION; GEOMETRY; IMAGE ENHANCEMENT; LIGHT SCATTERING; MODEL; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL PROCESSING;

EID: 0035062939     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00864.x     Document Type: Conference Paper

References (12)

1. Locally enhanced Raman spectroscopy with an atomic force microscope
2. Direct observation of locally enhanced electromagnetic field
3. Surface-enhanced and normal Stokes and anti-Stokes Raman spectroscopy of single-walled carbon nanotubes
4. Spectral response of plasmon resonant nanoparticles with a non-regular shape
5. Controlling and tuning strong optical field gradients at a local probe microscope tip apex
6. Probing single molecules and single nanoparticles by surface-enhanced Raman scattering
7. Theory of nanometric optical tweezers
8. The phenomenon of single-molecule detection by the SERS method and the SERS quadrupole theory
9. Nanoscale chemical analysis by tip-enhanced Raman spectroscopy
10. Surface-enhanced optical microscopy