Image enhancement in near-field scanning optical microscopy with laser-trapped metallic particles

Optics Letters

Volumn 24, Issue 2, 1999, Pages 74-76

  Gu, Min ^a   Ke, Pu Chun ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ENHANCEMENT; LASER BEAMS; LIGHT REFLECTION; LIGHT SCATTERING; MICROSCOPES; MIRRORS; PRISMS;

EVANESCENT WAVE INTERFERENCE PATTERN; LASER TRAPPED METALLIC PARTICLES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; NUMERICAL APERTURE; TOTAL INTERNAL REFLECTION;

OPTICAL MICROSCOPY;

EID: 0033554994     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.000074     Document Type: Article

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