Near-field Raman spectroscopy using a sharp metal tip

Journal of Microscopy

Volumn 210, Issue 3, 2003, Pages 234-240

  Hartschuh, A ^a   Anderson, N ^a   Novotny, L ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Carbon nanotubes; Near field microscopy; Surface enhanced Raman scattering

Indexed keywords

RAMAN SCATTERING; RAMAN SPECTROSCOPY; RASTERIZATION; SURFACE SCATTERING; YARN;

ENHANCED RAMAN SCATTERING; METAL TIP; NEAR FIELD MICROSCOPY; NEAR-FIELD RAMAN SPECTROSCOPY; RASTER SCANNING; SAMPLE SURFACE; SINGLE-WALLED CARBON; SPATIAL RESOLUTION; SURFACE ENHANCED RAMAN; SURFACE-ENHANCED RAMAN SCATTERING;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON; METAL; NANOTUBE;

ANALYTIC METHOD; ARTICLE; DEVICE; IMAGE ANALYSIS; NANOTECHNOLOGY; NEAR FIELD RAMAN SPECTROSCOPY; PRIORITY JOURNAL; QUANTITATIVE ASSAY; RASTER SCANNING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEPARATION TECHNIQUE; SPATIAL ORIENTATION; SURFACE PROPERTY; VIBRATION;

EID: 0038678028     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01137.x     Document Type: Article

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