Scanning microscopy by mid-infrared near-field scattering

Applied Physics A: Materials Science and Processing

Volumn 66, Issue 5, 1998, Pages 477-481

  Knoll, B ^a   Keilmann, F ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE LASERS; INFRARED RADIATION; INFRARED SPECTROSCOPY; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER;

MID INFRARED IMAGING; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);

LIGHT SCATTERING;

EID: 0032075127     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050699     Document Type: Article

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