Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 20, 2006, Pages

  Sugimoto, Yoshiaki ^a   Pou, Pablo ^b   Custance, Óscar ^a   Jelinek, Pavel ^c   Morita, Seizo ^a   Pérez, Rubén ^b   Abe, Masayuki ^a,d  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c INSTITUTE OF PHYSICS   (Czech Republic)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33646677697     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.205329     Document Type: Article

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