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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 12, 2000, Pages 8082-8086

Electronic structure of Sn/Si(111) √3×√3: Indications of a low-temperature phase

(6) Uhrberg, R I G a Zhang, H M a Balasubramanian, T a Jemander, S T a Lin, N a Hansson, G V a

a LINKÖPING UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; TIN;

ARTICLE; CHEMICAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRONICS; LOW TEMPERATURE PROCEDURES; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY;

EID: 0034664562 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.8082 Document Type: Article

Times cited : (63)

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