Non-contact atomic force microscopy study of the Sn/Si(1 1 1) mosaic phase

Applied Surface Science

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 23-27

  Sugimoto, Y ^a,b   Abe, M ^a   Yoshimoto, K ^a   Custance, O ^b   Yi, I ^b   Morita, S ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b Handai Frontier Research Center   (Japan)

Author keywords

Atom identification; Atomic resolution; Charge transfer; NC AFM; Non contact atomic force microscopy; Si; Sn

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; MONOLAYERS; NATURAL FREQUENCIES; OPTICAL RESOLVING POWER; SILICON; SURFACES;

ADATOMS; ATOM IDENTIFICATION; ATOMIC RESOLUTION; NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

TIN;

EID: 12344269124     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.012     Document Type: Conference Paper

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