STM study of the surface defects of the (√3×√3)-Sn/Si(1 1 1) surface

Surface Science

Volumn 475, Issue 1-3, 2001, Pages 181-193

  Jemander, S T ^a   Lin, N ^b   Zhang, H M ^a   Uhrberg, R I G ^a   Hansson, G V ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL DEFECTS; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SILICON; TIN;

SURFACE DEFECTS;

SURFACE STRUCTURE;

EID: 0035276197     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01100-6     Document Type: Article

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