Scanning tunneling spectroscopy investigation of the (√3 × √3) R30° Sn/Si(1 1 1) α and γ surfaces

Surface Science

Volumn 562, Issue 1-3, 2004, Pages 128-136

  Ressel, B ^a,b,d   Di Teodoro, C ^c   Profeta, G ^c   Ottaviano, L ^c   Chab V ^b   Prince, K C ^a,d  

^a Experimental Division   (Italy)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c UNIVERSITY OF L'AQUILA   (Italy)

^d LABORATORIO TASC   (Italy)

Author keywords

Scanning tunneling spectroscopies; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.); Tin

Indexed keywords

ELECTRONIC STRUCTURE; FERMI LEVEL; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE PHENOMENA; SURFACE STRUCTURE;

SURFACE ELECTRONIC PHENOMENA; SURFACE POTENTIALS; SURFACE STATES; WORK FUNCTIONS;

TIN COMPOUNDS;

EID: 3142529077     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.05.121     Document Type: Article

References (25)

1. Carpinelli J.M., Weitering H.H., Bartkowiak M., Plummer E.W., Stumpf R. Nature (London). 381:1996;398.
2. Carpinelli J.M., Weitering H.H., Bartkowiak M., Stumpf R., Plummer E.W. Phys. Rev. Lett. 79:1997;2859.
3. Santoro G., Scandolo S., Tosatti E. Phys. Rev. B. 59:1999;1891.
4. Profeta G., Continenza A., Ottaviano L., Mannstadt W., Freeman A.J. Phys. Rev. B. 62:2000;1556.
5. Custance O., Gómez-Rodríguez J.M., Baró A.M., Juré L., Mallet P., Veuillen J.-Y. Surf. Sci. 482:2001;1399.
6. Melechko A.V., Braun J., Weitering H.H., Plummer E.W. Phys. Rev. Lett. 83:1999;999.
7. Ottaviano L., Melechko A.V., Santucci S., Plummer E.W. Phys. Rev. Lett. 86:2001;1809.
8. Ottaviano L., Ressel B., Di Teodoro C., Profeta G., Santucci S., Cháb V., Prince K.C. Phys. Rev. B. 67:2003;045401.
9. Uhrberg R.I.G., Zhang H.M., Balasubramanian T., Jemander S.T., Lin N., Hansson G.V. Phys. Rev. B. 62:2000;8082.
10. Ottaviano L., Profeta G., Petaccia L., Santucci S., Pedio M. Surf. Sci. Lett. 501:2002;L171.
11. Pérez R., Ortega J., Flores F. Phys. Rev. Lett. 86:2001;4891.
12. Göthelid M., Björkvist M., Grehk T.M., Le Lay G., Karlsson U.O. Phys. Rev. B. 52:1995;R14352.
13. Avila J., Mascaraque A., Michel E.G., Asensio M.C., LeLay G., Ortega J., Pérez R., Flores F. Phys. Rev. Lett. 82:1999;442.
14. Charrier A., Pérez R., Thibaudau F., Debever J.-M., Ortega J., Flores F., Themlin J.-M. Phys. Rev. B. 64:2001;115407.
15. Kinoshita T., Kono S., Sagawa T. Phys. Rev. B. 34:1986;3011.
16. Kinoshita T., Ohta H., Enta Y., Yaegashi Y., Suzuki S., Kono S. J. Phys. Soc. Japan. 56:1987;4015.
17. Lobo J., Tejeda A., Murgaza A., Michel E.G. Phys. Rev. B. 68:2003;235332.
18. Slezák J., Mutombo P., Cháb V. Phys. Rev. B. 60:1999;13328.
19. Lin X.F., Chizhov I., Mai H.A., Willis R.F. Appl. Surf. Sci. 104:1996;223.
20. Mårtensson P., Feenstra R.M. Phys. Rev. B. 39:1989;7744.
21. Chen C.J. Introduction to Scanning Tunneling Microscopy. 1993;Oxford University Press, New York. p. 23.
22. Le Lay G. J. Phys. IV 7. C6:1997;115.
23. L. Petaccia, Ph.D. Thesis, University of Trieste, 2002.
24. Ressel B., Slezák J., Prince K.C., Cháb V. Phys. Rev. B. 66:2002;035325.
25. Gómez-Rodríguez J.M., Veuillen J.-Y., Cinti R.C. Surf. Sci. 379:1997;45.