Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: Characterization of interatomic van der waals forces

Physical Review Letters

Volumn 93, Issue 13, 2004, Pages

  Ashino, Makoto ^a   Schwarz, Alexander ^a   Behnke, Timo ^a   Wiesendanger, Roland ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTROSTATICS; ENERGY DISSIPATION; IMAGING TECHNIQUES; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS; THREE DIMENSIONAL; ULTRAHIGH VACUUM; VAN DER WAALS FORCES;

ATOMIC RESOLUTION DYNAMIC FORCE MICROSCOPY; CHEMICAL BONDING; FORCE FIELD SPECTROSCOPY; SINGLE-WALLED CARBON NANOTUBES;

CARBON NANOTUBES;

EID: 15844426440     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.136101     Document Type: Article

References (29)

1. S. Morita, R. Wiesendanger, and E. Meyer, Noncontact Atomic Force Microscopy (Springer, New York, 2002).
2. F. J. Giessibl, Science 267, 68 (1995).
3. B. Gotsmann and H. Fuchs, Phys. Rev. Lett. 86, 2597 (2001).
4. H. Hölscher et al., Phys. Rev. B 62, 6967 (2000).
5. H. Hölscher et al., Phys. Rev. Lett. 83, 4780 (1999).
6. U. Dürig, Appl. Phys. Lett. 76, 1203 (2000).
7. F. J. Giessibl, Appl. Phys. Lett. 78, 123 (2001).
8. M. A. Lantz et al., Science 291, 2580 (2001).
9. H. Hölscher et al., Appl. Phys. Lett. 81, 4428 (2002).
10. S. M. Langkat, Surf. Sci. 527, 12 (2003).
11. R. Pérez et al., Phys. Rev. B 58, 10835 (1998).
12. W. Allers et al., Europhys. Lett. 48, 276 (1999).
13. R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
14. J. Kong et al., Science 287, 2000 (2000).
15. S J. Tans, A. R. M. Verschueren, and C. Dekker, Nature (London) 393, 49 (1998).
16. K. A. Williams et al., Nature (London) 420, 761 (2002).
17. T. Werder et al., J. Phys. Chem. B 107, 1345 (2003).
18. G. Hummer, J. C. Rasiah, and J. P. Noworyta, Nature (London) 414, 188 (2001).
19. H. Gao et al., Nano Lett. 3, 471 (2003).
20. W. Allers et al., Rev. Sci. Instrum. 69, 221 (1998).
21. Silicon Cantilever SSS-NCL, Nanosensors, Switzerland.
22. A. Thess et al., Science 273, 483 (1996).
23. V. Meunier and P. Lambin, Phys. Rev. Lett. 81, 5588 (1998).
24. H. Hölscher et al., Phys. Rev. B 61, 12678 (2000).
25. Silicon Cantilever NCL, Nanosensors, Switzerland.
26. nom. = 2 nm.
27. H. Hölscher, U. D. Schwarz, and R. Wiesendanger, Appl. Surf. Sci. 140, 344 (1999).
28. 0, respectively. As discussed in Ref. [10], however, the estimated systematic error is about 30% in our experimental system.
29. 13 law, might occur.