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Volumn 23, Issue 5, 2004, Pages 776-792

Embedded deterministic test

Author keywords

Design for testability (DFT); Linear finite state machines; Manufacturing test; Test application time reduction; Test data volume compression

Indexed keywords

COMPUTER ARCHITECTURE; DATA COMPRESSION; DATA REDUCTION; ELECTRIC RESISTANCE; EMBEDDED SYSTEMS; IMAGE CODING; MICROPROCESSOR CHIPS;

EID: 2542432169     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2004.826558     Document Type: Article
Times cited : (452)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.