Automated synthesis of phase shifters for built-in self-test applications

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 10, 2000, Pages 1175-1188

  Ski, Janusz Raj ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; FLIP FLOP CIRCUITS; PHASE SHIFTERS; SHIFT REGISTERS;

AUTOMATED SYNTHESIS; CIRCUIT UNDER TEST; LINEAR FEEDBACK SHIFT REGISTER; LOGIC SIMULATION; REGISTER TRANSFER LEVEL; SYSTEM ON A CHIP TEST;

COMPUTER AIDED LOGIC DESIGN;

EID: 0034296172     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.875312     Document Type: Article

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