Logic BIST for large industrial designs: real issues and case studies

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 358-367

  Hetherington, Graham ^a   Fryars, Tony ^a   Tamarapalli, Nagesh ^a   Kassab, Mark ^a   Hassan, Abu ^a   Rajski, Janusz ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DESIGN FOR TESTABILITY; FREQUENCIES; LOGIC GATES; MOS DEVICES; PHASE LOCKED LOOPS; PRODUCT DESIGN; RANDOM ACCESS STORAGE;

AREA OVERHEAD; AUTOMATIC TEST PATTERN GENERATION; FAULT GRADES; LOGIC BUILT-IN SELF TEST;

BUILT-IN SELF TEST;

EID: 0033309980     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)