High speed ring generators and compactors of test data [logic IC test]

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 57-62

  Mrugalski, G ^b   Rajski, J ^a   Tyszer, J ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Automata; Automatic testing; Feedback; Flip flops; Graphics; Integrated circuit interconnections; Logic; Polynomials; Ring generators; Test pattern generators

Indexed keywords

AUTOMATIC TESTING; FEEDBACK; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT INTERCONNECTS; POLYNOMIALS;

AUTOMATA; GRAPHICS; INTEGRATED CIRCUIT INTERCONNECTIONS; LOGIC; RING GENERATORS; TEST PATTERN GENERATOR;

INTEGRATED CIRCUIT TESTING;

EID: 77951163063     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197633     Document Type: Conference Paper

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