Dynamic test compression using statistical coding

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 143-150

  Ichihara, Hideyuki ^a   Ogawa, Atsuhiro ^a   Inoue, Tomoo ^a   Tamura, Akio ^a  

^a HIROSHIMA CITY UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DESIGN FOR TESTABILITY; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS; VLSI CIRCUITS;

DYNAMIC TEST COMPRESSION; STATISTICAL CODING; TEST GENERATION METHOD;

INTEGRATED CIRCUIT TESTING;

EID: 0035701567     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990273     Document Type: Article

References (7)

1. COMPACT: A hybrid method for compressing test data
2. Test vector decompression via cyclical scan chains and its application to testing core-based designs
3. Test data compression for system-on-a-chip using Golomb codes
4. Built-in self testing of sequential circuits using precomputed test sets
5. Scan vector compression/decompression using statistical coding
6. Test transformation to improve compression by statistical encoding
7. SOCRATES: A highly efficient automatic test pattern generation system