Using a single input to support multiple scan chains

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 74-78

  Lee, Kuen Jong ^a   Chen, Jih Jeen ^a   Huang, Cheng Hua ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER TESTING; DESIGN FOR TESTABILITY; SEQUENTIAL CIRCUITS;

AUTOMATIC TEST PATTERN GENERATION (ATPG); BOUNDARY SCAN;

COMPUTER ARCHITECTURE;

EID: 0032306324     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.288563     Document Type: Conference Paper

References (13)