Application of Saluja-Karpovsky compactors to test responses with many unknowns

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 107-112

  Patel, J H ^a   Lumetta, S S ^a   Reddy, S M ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

Circuit testing; Cities and towns; Compaction; Design for testability; Engineering profession; Error correction codes; Hardware; Logic testing; Pins; Shift registers

Indexed keywords

CODES (SYMBOLS); COMPACTION; COMPUTER HARDWARE; DESIGN FOR TESTABILITY; ERROR CORRECTION; ERRORS; HARDWARE; LOGIC CIRCUITS; PROFESSIONAL ASPECTS; SHIFT REGISTERS; VLSI CIRCUITS;

CIRCUIT TESTING; CITIES AND TOWNS; ENGINEERING PROFESSION; ERROR CORRECTION CODES; LOGIC TESTING; PINS;

ERROR DETECTION;

EID: 84943569678     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197640     Document Type: Conference Paper

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