Linear independence as evaluation criterion for two-dimensional test pattern generators

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 377-386

  Mrugalski, Grzegorz ^a   Tyszer, Jerzy ^a   Rajski, Janusz ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER ARCHITECTURE; FINITE AUTOMATA; SHIFT REGISTERS; TWO DIMENSIONAL;

LINEAR INDEPENDENCE; TWO DIMENSIONAL TEST PATTERN GENERATORS;

BUILT-IN SELF TEST;

EID: 0033733910     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (24)