Two-dimensional test data compression for scan-based deterministic BIST

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 894-902

  Liang, Hua Guo ^a   Hellebrand, Sybille ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; DATA COMPRESSION; DATA STORAGE EQUIPMENT; ENCODING (SYMBOLS);

AUTOMATIC TEST EQUIPMENTS (ATE);

BUILT-IN SELF TEST;

EID: 0035687722     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)

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