Test data compression for system-on-a-chip using Golomb codes

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 113-120

  Chandra, Anshuman ^a   Chakrabarty, Krishnendu ^a  

^a DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CODES (SYMBOLS); COMPUTER SIMULATION; DATA COMPRESSION; INTEGRATED CIRCUIT TESTING;

DECOMPRESSION ARCHITECTURE; FULL SCAN CIRCUITS; GOLOMB CODES; NONSCAN CIRCUITS; PRECOMPUTED TEST SETS; STATISTICAL CODING; SYSTEM ON A CHIP;

MICROPROCESSOR CHIPS;

EID: 0033741842     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (19)