Scan vector compression/decompression using statistical coding

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 114-120

  Jas, Abhijit ^a   Ghosh Dastidar, Jayabrata ^a   Touba, Nur A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); DATA COMPRESSION; DATA STORAGE EQUIPMENT; DECODING; ENCODING (SYMBOLS); STATISTICAL METHODS; VECTORS;

AUTOMATED TEST EQUIPMENT; HUFFMAN CODE; STATISTICAL CODING;

INTEGRATED CIRCUIT TESTING;

EID: 0032682922     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)