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Volumn 19, Issue 6, 2001, Pages 2529-2532
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Ion beam aperture-array lithography
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
IONS;
MATHEMATICAL MODELS;
NANOSTRUCTURED MATERIALS;
OPTIMIZATION;
DOSE COMPENSATION;
ION BEAM APERTURE ARRAY LITHOGRAPHY;
STENCIL MASK;
ION BEAM LITHOGRAPHY;
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EID: 0035519469
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1420578 Document Type: Article |
Times cited : (35)
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References (14)
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