On the geometry dependence of the i// noise in CMOS compatible junction diodes

IEEE Transactions on Electron Devices

Volumn 46, Issue 8, 1999, Pages 1725-1732

  Simoen, Eddy ^a,b   Claeys, Cor L ^a  

^a IEEE   (Belgium)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT DENSITY; HETEROJUNCTIONS; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE; SUBSTRATES;

CMOS COMPATIBLE JUNCTION DIODES; LOW FREQUENCY NOISE;

SEMICONDUCTOR DIODES;

EID: 0033169523     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.777163     Document Type: Article

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