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Physical Review B

Volumn 33, Issue 7, 1986, Pages 4898-4905

Theory and experiment on the 1/f noise in p-channel metal-oxide- semiconductor field-effect transistors at low drain bias

(2) Surya, Charles a Hsiang, Thomas Y a

a UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000299051 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.33.4898 Document Type: Article

Times cited : (86)

References (43)

1
- 0018738114
- (1979) Adv. Electron. Electron Phys. , vol.49 , pp. 225
- van der Ziel, A.¹

2
- 0015299686
- (1972) IEEE Trans. Electron Devices ED - , vol.19 , pp. 273
- Fu, H.S.¹ Sah, C.T.²

3
- 49949124297
- (1968) Solid-State Electron. , vol.11 , pp. 797
- Christensson, S.¹ Lundstrom, I.²

4
- 49949123474
- (1968) Solid-State Electron. , vol.11 , pp. 813
- Christensson, S.¹ Lundstrom, I.²

5
- 0015142053
- Characterization of low 1/f noise in MOS transistors
- (1971) IEEE Transactions on Electron Devices , vol.18 , pp. 887
- Klaassen, F.M.¹

6
- 0014883771
- (1970) Solid-State Electron. , vol.13 , pp. 1451
- Hsu, S.T.¹

7
- 84926534664
- H. Katto, M. Aoki, and E. Yamada, in Proceedings of the Symposium on 1/f Fluctuations, Conference Report, p. 148 (1977) (unpublished).

8
- 0016070470
- (1974) Proc. IEEE , vol.62 , pp. 859
- Cheng, Y.C.¹ Haslett, J.W.² Kendall, E.J.M.³ Kriegler, R.J.⁴ Scholz, F.J.⁵

9
- 0003788668
- edited by, R. H. Kingston, University of Pennsylvania Press, Philadelphia
- (1957) Semiconductor Surface Physics
- McWhorter, A.L.¹

10
- 21544434131
- (1981) Rep. Prog. Phys. , vol.44 , pp. 479
- Hooge, F.N.¹ Kleinpenning, T.G.M.² Vandamme, L.K.J.³

11
- 0001268869
- (1976) Phys. Rev. B , vol.13 , pp. 556
- Voss, R.F.¹ Clarke, J.²

12
- 0018059654
- (1978) Adv. Electron. Electron Phys. , vol.46 , pp. 313
- van der Ziel, A.¹ Chenette, E.R.²

13
- 84926572188
- (1976) Physica 83 , vol.B , pp. 41
- van der Ziel, A.¹

14
- 35949025938
- (1984) Phys. Rev. Lett. , vol.52 , pp. 228
- Ralls, K.S.¹ Skocpol, W.J.² Jackel, L.D.³ Howard, R.E.⁴ Fetter, L.A.⁵ Epworth, R.W.⁶ Tennant, D.M.⁷

15
- 0022237493
- Study of 1/f noise in N-MOSFET's: Linear region
- (1985) IEEE Transactions on Electron Devices , vol.32 , pp. 2797
- Celik, Z.¹ Hsiang, T.Y.²

16
- 0014777697
- (1970) Solid-State Electron. , vol.13 , pp. 631
- Berz, F.¹

17
- 0001151771
- (1984) Phys. Rev. Lett. , vol.53 , pp. 1272
- Rogers, C.T.¹ Buhrman, R.A.²

18
- 0008649375
- (1981) Rev. Mod. Phys. , vol.53 , pp. 497
- Dutta, P.¹ Horn, P.M.²

19
- 84926541069
- R. H. Koch, in Noise in Physical Systems and 1/f Noise, edited by M. Savelli, G. Lecoy, and J. Nougier (North-Holland, Amsterdam, 1983), p. 377.

20
- 84896741951
- (1966) IEEE Trans. Electron Devices ED - , vol.13 , pp. 701
- Berglund, C.N.¹

21
- 0017956513
- Measurements of residual defects and 1/f noise in ion-implanted p-channel MOSFET's
- (1978) IEEE Transactions on Electron Devices , vol.25 , pp. 478
- Wang, K.L.¹

22
- 0002956604
- (1966) Appl. Phys. Lett. , vol.8 , pp. 31
- Gray, P.V.¹ Brown, D.M.²

23
- 0014805372
- (1970) Solid-State Electron. , vol.13 , pp. 873
- Kuhn, M.¹

24
- 0003663467
- McGraw-Hill, New York
- (1965) Probability, Random Variables and Stochastic Processes
- Papoulis, A.¹

25
- 0342956106
- (1981) J. Stat. Phys. , vol.25 , pp. 253
- Nelkin, M.¹ Tremblay, A.M.S.²

26
- 36149027699
- (1945) Rev. Mod. Phys. , vol.17 , pp. 323
- Wang, M.C.¹ Uhlenbeck, G.E.²

27
- 84939730902
- Mathematical Analysis of Random Noise
- (1944) Bell System Technical Journal , vol.23 , pp. 282
- Rice, S.O.¹

28
- 84944485718
- Mathematical Analysis of Random Noise
- (1945) Bell System Technical Journal , vol.24 , pp. 46
- Rice, S.O.¹

29
- 0343738075
- (1976) Phys. Rev. B , vol.13 , pp. 4790
- Clarke, J.¹ Hsiang, T.Y.²

30
- 84944483309
- The Linear Theory of Fluctuations Arising from Diffusional Mechanisms-An Attempt at a Theory of Contact Noise
- (1950) Bell System Technical Journal , vol.29 , pp. 117
- Richardson, J.M.¹

31
- 84926591019
- (1969) Phys. Lett. , vol.10 , pp. 259
- Hooge, F.N.¹

32
- 0019476721
- (1981) J. Appl. Phys. , vol.52 , pp. 296
- Park, H.S.¹ van der Ziel, A.² Zijlistra, R.J.J.³ Liu, S.T.⁴

33
- 0019576740
- (1981) J. Appl. Phys. , vol.52 , pp. 4300
- van der Ziel, A.¹ Zijlstra, R.J.J.² Park, H.S.³

34
- 84987101024
- (1980) Phys. Lett. 78 , vol.A , pp. 385
- Bosman, G.¹ Zijlstra, R.J.J.² van Rheenen, A.³

35
- 0003666012
- Wiley, New York
- (1983) VLSI Fabrication Principles
- Ghandi, S.K.¹

36
- 84926608518
- Philips ECG, Inc., Waltham, Massachusetts.

37
- 0000843583
- (1983) Phys. Rev. B , vol.28 , pp. 3625
- Fleetwood, D.M.¹ Giordano, N.J.²

38
- 84926603841
- Monsanto, St. Peters, Missouri
- (1971) Some Properties of Semiconductors
- Hill, D.E.¹

39
- 84926544315
- (private communication).
- Skocpol, W.J.¹

40
- 0017679231
- (1977) J. Appl. Phys. , vol.48 , pp. 5135
- Aoki, M.¹ Katto, H.² Yamada, E.³

41
- 0003605465
- (1967) Philips Res. Rep. , vol.22 , pp. 505
- Klaassen, F.M.¹ Prins, J.²

42
- 0003768306
- Wiley, New York, Chap. 7.
- (1976) Noise in Measurement
- van der Ziel, A.¹

43
- 0004005306
- Wiley, New York, Chap. 8.
- (1981) Physics of Semiconductor Devices, 2nd ed.
- Sze, S.M.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.