1/f noise in n+-p-n microwave transistors

Solid State Electronics

Volumn 28, Issue 5, 1985, Pages 473-477

  Zhu, X C ^a   Pawlikiewicz, A ^a   van der Ziel, A ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE, SPURIOUS SIGNAL - MEASUREMENTS;

BASE CURRENT; COLLECTOR CURRENT; MOBILITY FLUCTUATION;

TRANSISTORS;

EID: 0022059831     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(85)90110-8     Document Type: Article

References (5)

1. Solid-St. Electron.