Impact of the substrate on the low-frequency noise of silicon n+p junction diodes

Applied Physics Letters

Volumn , Issue , 1995, Pages 2507-

  Simoen, E ^a   Bosman, G ^a,b   Vanhellemont, J ^a   Claeys, C ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449004545     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.113149     Document Type: Article

References (16)