Reduction of Popcorn Noise in Integrated Circuits

IEEE Transactions on Electron Devices

Volumn 22, Issue 10, 1975, Pages 962-964

  Roedel, R ^a   Viswanathan, C R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES - NOISE;

INTEGRATED CIRCUITS;

EID: 0016559525     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1975.18251     Document Type: Article

References (6)

1. P. L. Leonard and L. V. Jaskowlski, “An investigation into the origin and nature of popcorn noise,” Proc. IEEE (Lett.), vol. 57, pp. 1786–1788, Oct. 1969.
2. K. F. Knott, “Burst noise and microplasma noise in silicon planar transistors,” Proc. IEEE (Lett.), pp. 1368–1369, Sept. 1970.
3. R. Oren, “Discussion of various views on popcorn noise,” IEEE Trans. Electron Devices, vol. ED-18, pp. 1194–1195, Dec. 1971.
4. S. T. Hsu, R. J. Whtttler, and C. A. Mead, Solid-State Electron., vol. 13. pp. 1055–1071, July 1970.
5. G. H. Plantinga, “Influence of dislocations on properties of shallow diffused transistors,” IEEE Trans. Electron Devices, vol. ED-l6, pp. 394–400, Apr. 1969.
6. M. Nishida, “Effects of diffusion-induced dislocations on the low-frequency noise,” IEEE Trans. Electron Devices, vol. ED-20, pp. 221–226, Mar. 1973.