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Volumn 48, Issue 2, 1970, Pages 242-246

The surface recombination model of p-n diode flicker noise

(1) Van der Ziel, A a

a UNIVERSITY OF MINNESOTA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846604522 PISSN: 00318914 EISSN: None Source Type: Journal
DOI: 10.1016/0031-8914(70)90025-X Document Type: Article

Times cited : (33)

References (6)

1
- 7544227729
- RCA Laboratories, Princeton N.J
- (1956) Transistors I
- Fonger¹

2
- 36149067896
- (1959) Proc. Phys. Soc. , vol.73 , pp. 59
- Watkins¹

3
- 0001468577
- (1968) Appl. Phys. Letters , vol.12 , pp. 287
- Hsu¹ Fitzgerald² Grove³

4
- 84914021098
- (1967) Radiotekhnika i Electronika , vol.12 , pp. 946
- Gutkov¹

5
- 0003885583
- T, which, in turn, is proportional to s.
- (1970) Noise; Sources, Characterization Measurement
- van der Ziel¹

6
- 0000747016
- Flicker noise in transistors
- (1963) IEEE Transactions on Electron Devices , vol.10 ED , pp. 304
- Plumb¹ Chennette²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.