Bulk defect induced low-frequency noise in n+-p silicon diodes

IEEE Transactions on Electron Devices

Volumn 45, Issue 12, 1998, Pages 2528-2536

  Hou, Fan Chi ^a   Bosman, Gijs ^a  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

Charge carrier processes; Diodes; Semiconductor device noise; Trapping noise

Indexed keywords

CHARGE CARRIERS; CRYSTAL DEFECTS; HOLE TRAPS; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

LOW FREQUENCY NOISE;

SEMICONDUCTOR DIODES;

EID: 0032309647     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.735731     Document Type: Article

References (9)

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