Extraction of the minority carrier recombination lifetime from forward diode characteristics

Applied Physics Letters

Volumn , Issue , 1995, Pages 2894-

  Vanhellemont, J ^a   Simoen, E ^a   Claeys, C ^a  

^a IMEC   (Belgium)

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EID: 36449004978     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.113465     Document Type: Article

References (6)