Identification of 1/f diffusion and recombination noise sources in bipolar transistors

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1990, Pages 25-28

  Decoutere, S ^a   Deferm, L ^a   Vanhorebeek, G ^a   Claeys, C ^a   Declerck, G ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS; INTEGRATED CIRCUITS, CMOS;

1/F NOISE MEASUREMENTS; BICMOS; NOISE SOURCES; NPN TRANSISTORS;

TRANSISTORS, BIPOLAR;

EID: 0025575637     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)