Noise characterization of gated silicon p-n diodes

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 542-545

  Hou, Fan Chi ^a   Bosman, Gijs ^a   Simoen, Eddy ^a   Claeys, Cor ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC SPACE CHARGE; ELECTRON TRAPS; SIGNAL NOISE MEASUREMENT; SILICON WAFERS; SPURIOUS SIGNAL NOISE;

GATED SILICON DIODES; LOW FREQUENCY NOISE;

SEMICONDUCTOR DIODES;

EID: 0031295915     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)