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Journal of Applied Physics

Volumn 77, Issue 11, 1995, Pages 5669-5676

Impact of oxygen related extended defects on silicon diode characteristics

(5) Vanhellemont, J a Simoen, E a Kaniava, A a Libezny, M a Claeys, C a

a IMEC (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000283961 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.359209 Document Type: Article

Times cited : (89)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.