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Volumn 180, Issue 2, 1996, Pages 460-465
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Direct measurement of repulsive van der Waals interactions using an atomic force microscope
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Author keywords
atomic force microscopy; surface forces; van der Waals forces
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Indexed keywords
GOLD;
POLITEF;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
COLLOID;
PHYSICAL CHEMISTRY;
PRIORITY JOURNAL;
SPECTROSCOPY;
THEORETICAL STUDY;
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EID: 0030601116
PISSN: 00219797
EISSN: None
Source Type: Journal
DOI: 10.1006/jcis.1996.0326 Document Type: Article |
Times cited : (142)
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References (21)
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