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Volumn 180, Issue 2, 1996, Pages 460-465

Direct measurement of repulsive van der Waals interactions using an atomic force microscope

Author keywords

atomic force microscopy; surface forces; van der Waals forces

Indexed keywords

GOLD; POLITEF;

EID: 0030601116     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.1996.0326     Document Type: Article
Times cited : (142)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.