Direct measurement of repulsive and attractive van der Waals forces between inorganic materials

Langmuir

Volumn 13, Issue 14, 1997, Pages 3896-3899

  Meurk, Anders ^a   Luckham, Paul F ^b   Bergström, Lennart ^a  

^a INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METHANE; NAPHTHALENE; POLYTETRAFLUOROETHYLENES; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON NITRIDE; VAN DER WAALS FORCES;

BRROMONAPHTHALENE; DIIODOMETHANE; NONRETARDED HAMAKER CONSTANTS;

INORGANIC COMPOUNDS;

EID: 0031561048     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9610967     Document Type: Article

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