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Volumn 100, Issue 41, 1996, Pages 16700-16705

Measuring electrostatic double-layer forces at high surface potentials with the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000196005     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp961549g     Document Type: Article
Times cited : (51)

References (65)
  • 17
    • 85033068718 scopus 로고    scopus 로고
    • Such an interacting area results if the force acts over a distance of 10 nm
    • Such an interacting area results if the force acts over a distance of 10 nm.
  • 35
    • 0001925517 scopus 로고
    • Schrader, M. E.; Loeb, G., Eds.; Plenum Press: New York
    • Christenson, H. K. In Modern Approaches to Wettability; Schrader, M. E.; Loeb, G., Eds.; Plenum Press: New York, 1992; p 29.
    • (1992) Modern Approaches to Wettability , pp. 29
    • Christenson, H.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.