메뉴 건너뛰기




Volumn 16, Issue 2, 1997, Pages 58-65

Force-distance curves by AFM

Author keywords

[No Author keywords available]

Indexed keywords

FORCE DISTANCE CURVES; HOOKE LAW; JUMP OFF CONTACT; PULL OFF FORCES;

EID: 0031104940     PISSN: 07395175     EISSN: None     Source Type: Journal    
DOI: 10.1109/51.582177     Document Type: Review
Times cited : (81)

References (41)
  • 1
    • 0000383748 scopus 로고
    • Electrostatic and contact forces in force microscopy
    • Hao HW, Barò AM, Saenz JJ: Electrostatic and contact forces in force microscopy. J Vac Sci Technol B 9:1323, 1991.
    • (1991) J Vac Sci Technol B , vol.9 , pp. 1323
    • Hao, H.W.1    Barò, A.M.2    Saenz, J.J.3
  • 3
    • 0011324577 scopus 로고
    • Probing the surface forces of monolayer films with an atomic force microscope
    • Burnham NA, Dominguez DD, Mowery RL, Colton RJ: Probing the surface forces of monolayer films with an atomic force microscope. Phys Rev Lett 64:1931, 1990.
    • (1990) Phys Rev Lett , vol.64 , pp. 1931
    • Burnham, N.A.1    Dominguez, D.D.2    Mowery, R.L.3    Colton, R.J.4
  • 4
    • 0000746799 scopus 로고
    • Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope
    • Weisenhorn AL, Maivald P, Butt HJ, Hansma PK: Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope. Phys Rev B 45:11226, 1992.
    • (1992) Phys Rev B , vol.45 , pp. 11226
    • Weisenhorn, A.L.1    Maivald, P.2    Butt, H.J.3    Hansma, P.K.4
  • 7
    • 0000635852 scopus 로고
    • Interaction forces of a sharp tungsten tip with molecular films on silicon surfaces
    • Blackman GS, Mate CM, Philpott MR: Interaction forces of a sharp tungsten tip with molecular films on silicon surfaces. Phys Rev Lett 65:2270, 1990.
    • (1990) Phys Rev Lett , vol.65 , pp. 2270
    • Blackman, G.S.1    Mate, C.M.2    Philpott, M.R.3
  • 8
    • 0001443786 scopus 로고
    • Effect of PZT and PMN actuator hysteresis and creep on nanoindentation measurements using force microscopy
    • Hues SM, Draper CF, Lee KP, Colton RJ: Effect of PZT and PMN actuator hysteresis and creep on nanoindentation measurements using force microscopy. Rev Sci Instrum 65:1561, 1994.
    • (1994) Rev Sci Instrum , vol.65 , pp. 1561
    • Hues, S.M.1    Draper, C.F.2    Kp, L.3    Colton, R.J.4
  • 9
    • 0001353845 scopus 로고
    • Friction effects on force measurements with an atomic force microscope
    • Hoh JH, Engel A: Friction effects on force measurements with an atomic force microscope. Langmuir 9:3310 1993.
    • (1993) Langmuir , vol.9 , pp. 3310
    • Hoh, J.H.1    Engel, A.2
  • 10
    • 84986648597 scopus 로고
    • Comparative study of lithium fluoride and graphite by atomic force microscopy
    • Meyer E, et al: Comparative study of lithium fluoride and graphite by atomic force microscopy. J of Microscopy 152:269, 1988.
    • (1988) J of Microscopy , vol.152 , pp. 269
    • Meyer, E.1
  • 11
    • 0000791128 scopus 로고
    • Atomistic mechanisms and dynamics of adhesion, nanoindentation and fracture
    • Landman U, Luedtke WD, Burnham NA, Colton RJ: Atomistic mechanisms and dynamics of adhesion, nanoindentation and fracture. Science 248:454, 1990.
    • (1990) Science , vol.248 , pp. 454
    • Landman, U.1    Luedtke, W.D.2    Burnham, N.A.3    Colton, R.J.4
  • 12
    • 4143122639 scopus 로고
    • Atomic force microscopy of polymeric liquid films
    • Mate CM, Lorenz MR, Novotny VJ: Atomic force microscopy of polymeric liquid films. J Chem Phys 90:7550, 1990.
    • (1990) J Chem Phys , vol.90 , pp. 7550
    • Mate, C.M.1    Lorenz, M.R.2    Novotny, V.J.3
  • 13
    • 0015396878 scopus 로고
    • On the electrostatic interaction across a salt solution between two bodies bearing unequal charges
    • Parsegian VA, Gingell D: On the electrostatic interaction across a salt solution between two bodies bearing unequal charges. Biophys J 12:1192, 1972.
    • (1972) Biophys J , vol.12 , pp. 1192
    • Parsegian, V.A.1    Gingell, D.2
  • 14
    • 0026038548 scopus 로고
    • Electrostatic interaction in atomic force microscopy
    • Butt HJ: Electrostatic interaction in atomic force microscopy. Biophys J 60:777, 1991.
    • (1991) Biophys J , vol.60 , pp. 777
    • Butt, H.J.1
  • 15
    • 0028482524 scopus 로고
    • Measurements of elettrostatic double-layer forces due to charged functional groups on Langmuir-Blodgett films with an atomic force microscope
    • Ishino T, Hieda H, Tanaka K, Gemma N: Measurements of elettrostatic double-layer forces due to charged functional groups on Langmuir-Blodgett films with an atomic force microscope. Jpn J Appl Phys 33:4718, 1994.
    • (1994) Jpn J Appl Phys , vol.33 , pp. 4718
    • Ishino, T.1    Hieda, H.2    Tanaka, K.3    Gemma, N.4
  • 16
    • 0028542557 scopus 로고
    • Electrical double-layer forces measured with an atomic force microscope while electrochemically controlling surface potential of the cantilever
    • Ishino T, Hieda H, Tanaka K, Gemma N: Electrical double-layer forces measured with an atomic force microscope while electrochemically controlling surface potential of the cantilever. Jpn J Appl Phys 33:L1552, 1994.
    • (1994) Jpn J Appl Phys , vol.33
    • Ishino, T.1    Hieda, H.2    Tanaka, K.3    Gemma, N.4
  • 17
    • 0029764756 scopus 로고    scopus 로고
    • pH-dependent charge density at the insulator-electrolyte interface probed by a scanning force microscope
    • submitted to
    • Raiteri R, Martinoia S, Grattarola M: pH-dependent charge density at the insulator-electrolyte interface probed by a scanning force microscope. Biosensors and Bioelectronics (submitted to).
    • Biosensors and Bioelectronics
    • Raiteri, R.1    Martinoia, S.2    Grattarola, M.3
  • 18
    • 0026317248 scopus 로고
    • Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope
    • Butt HJ: Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope. Biophys J 60:1438, 1991.
    • (1991) Biophys J , vol.60 , pp. 1438
    • Butt, H.J.1
  • 19
    • 0030052290 scopus 로고    scopus 로고
    • Role of hydration and water structure in biological and colloidal interactions
    • Israelachvili J, Wennerstrom H: Role of hydration and water structure in biological and colloidal interactions. Nature 379:219, 1996.
    • (1996) Nature , vol.379 , pp. 219
    • Israelachvili, J.1    Wennerstrom, H.2
  • 20
    • 0029270828 scopus 로고
    • A study of hydrophobic interactions between stainless steel and silanated glass surface using atomic force microscopy
    • Mantel M, Rabinovich YI, Wightman JP, Yoon RH: A study of hydrophobic interactions between stainless steel and silanated glass surface using atomic force microscopy. J of colloid and interface Science 170:203, 1995.
    • (1995) J of Colloid and Interface Science , vol.170 , pp. 203
    • Mantel, M.1    Rabinovich, Y.I.2    Wightman, J.P.3    Yoon, R.H.4
  • 21
    • 0027922464 scopus 로고
    • Long range attractive force between hydrophobic surfaces observed by atomic force microscopy
    • Tsao YH, Fennell Evans D, Wennerstrom H: Long range attractive force between hydrophobic surfaces observed by atomic force microscopy. Science 262: 547, 1993.
    • (1993) Science , vol.262 , pp. 547
    • Tsao, Y.H.1    Fennell Evans, D.2    Wennerstrom, H.3
  • 22
    • 0028766108 scopus 로고
    • Use of atomic force microscope for the measurements of hydrophobic forces
    • Rabinovich Yal, Yoon RH: Use of atomic force microscope for the measurements of hydrophobic forces. Colloids and surfaces A 93: 263, 1994.
    • (1994) Colloids and Surfaces A , vol.93 , pp. 263
    • Rabinovich, Y.1    Yoon, R.H.2
  • 23
    • 22544441553 scopus 로고
    • Van der Waals interactions between sharp probes and flat sample surfaces
    • Hartmann U: Van der Waals interactions between sharp probes and flat sample surfaces. Phys Rev B 43:2404, 1991.
    • (1991) Phys Rev B , vol.43 , pp. 2404
    • Hartmann, U.1
  • 24
    • 0026897008 scopus 로고
    • Intermolecular and surface forces in noncontact scanning force microscopy
    • Hartmann U: Intermolecular and surface forces in noncontact scanning force microscopy. Ultramicroscopy 42-44:59, 1992.
    • (1992) Ultramicroscopy , vol.42-44 , pp. 59
    • Hartmann, U.1
  • 25
    • 0000225463 scopus 로고
    • Manipulation of van der Waals forces to improve image resolution in atomic-force microscopy
    • Hutter LJ, Bechhoefer J: Manipulation of van der Waals forces to improve image resolution in atomic-force microscopy. J Appl Phys 73:4123, 1993.
    • (1993) J Appl Phys , vol.73 , pp. 4123
    • Hutter, L.J.1    Bechhoefer, J.2
  • 26
    • 0028997572 scopus 로고
    • Imaging soft samples with the atomic force microscope: Gelatin in water and propanol
    • Radmacher M, Fritz M, Hansma PK: Imaging soft samples with the atomic force microscope: gelatin in water and propanol. Biophys J 69:264, 1995.
    • (1995) Biophys J , vol.69 , pp. 264
    • Radmacher, M.1    Fritz, M.2    Hansma, P.K.3
  • 29
    • 0001150505 scopus 로고
    • Solvation forces near a graphite surface measured with an atomic force microscope
    • O'Shea SJ, Weiland ME, Rayment T: Solvation forces near a graphite surface measured with an atomic force microscope. Appl Phys Lett 60:2356, 1992.
    • (1992) Appl Phys Lett , vol.60 , pp. 2356
    • O'Shea, S.J.1    Weiland, M.E.2    Rayment, T.3
  • 31
    • 0028309424 scopus 로고
    • Adhesion forces between individual ligand receptor pairs
    • Florin EL, Moy VT, Gaub HE: Adhesion forces between individual ligand receptor pairs. Science 264:415, 1994.
    • (1994) Science , vol.264 , pp. 415
    • Florin, E.L.1    Moy, V.T.2    Gaub, H.E.3
  • 32
    • 0028140707 scopus 로고
    • Intermolecular forces and energies between ligands and receptors
    • Moy VT, Florin EL, Gaub HE: Intermolecular forces and energies between ligands and receptors. Science 266:257, 1994.
    • (1994) Science , vol.266 , pp. 257
    • Moy, V.T.1    Florin, E.L.2    Gaub, H.E.3
  • 33
    • 0028514424 scopus 로고
    • Adhesion force measurements using an atomic force microscope upgraded with a linear position sensitive detector
    • Pierce M, Stuart J, Pungor A, Dryden P, Hlady V: Adhesion force measurements using an atomic force microscope upgraded with a linear position sensitive detector. Langmuir 10:3217, 1994.
    • (1994) Langmuir , vol.10 , pp. 3217
    • Pierce, M.1    Stuart, J.2    Pungor, A.3    Dryden, P.4    Hlady, V.5
  • 34
    • 0027541238 scopus 로고
    • Discriminating molecular length of chemically adsorbed molecules using an atomic force microscope having a tip covered with sensor molecules
    • Nakagawa T, Ogawa K, Kurumizawa T, Ozaki S: Discriminating molecular length of chemically adsorbed molecules using an atomic force microscope having a tip covered with sensor molecules. Jpn J Appl Phys 32:L294, 1993.
    • (1993) Jpn J Appl Phys , vol.32
    • Nakagawa, T.1    Ogawa, K.2    Kurumizawa, T.3    Ozaki, S.4
  • 35
    • 0028007197 scopus 로고
    • Direct measurement of the forces between complementary strands of DNA
    • Lee GU, Chrisey LA, Colton RJ: Direct measurement of the forces between complementary strands of DNA. Science 266:771, 1994.
    • (1994) Science , vol.266 , pp. 771
    • Lee, G.U.1    Chrisey, L.A.2    Colton, R.J.3
  • 38
    • 0028462809 scopus 로고
    • Imaging spectroscopy with the atomic force microscope
    • Baselt DR, Baldeschwieler JD: Imaging spectroscopy with the atomic force microscope, J Appl Phys, 76:33, 1994.
    • (1994) J Appl Phys , vol.76 , pp. 33
    • Baselt, D.R.1    Baldeschwieler, J.D.2
  • 39
    • 0029378740 scopus 로고
    • Design and calibration of a scanning force microscope for friction, adhesion, and contact potential studies
    • Koleske DD et al.: Design and calibration of a scanning force microscope for friction, adhesion, and contact potential studies. Rev Sci Instrum, 66:4566, 1995.
    • (1995) Rev Sci Instrum , vol.66 , pp. 4566
    • Koleske, D.D.1
  • 40
    • 0031165193 scopus 로고    scopus 로고
    • Improvements in AFM imaging of the spatial variation of force distance curves: On-line images
    • submitted to
    • Cappella B, Baschieri P, Frediani C, Miccoli P, Ascoli C: Improvements in AFM imaging of the spatial variation of force distance curves: on-line images. Nanotechnology (submitted to)
    • Nanotechnology
    • Cappella, B.1    Baschieri, P.2    Frediani, C.3    Miccoli, P.4    Ascoli, C.5
  • 41
    • 0000561825 scopus 로고
    • Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities
    • Mizes HA Loh KG, Miller RJD, Ahuja SK, Grabowski EF: Submicron probe of polymer adhesion with atomic force microscopy: dependence on topography and material inhomogeneities. Appl Phys Lett 59:2901, 1991.
    • (1991) Appl Phys Lett , vol.59 , pp. 2901
    • Mizes, H.A.1    Loh, K.G.2    Miller, R.J.D.3    Ahuja, S.K.4    Grabowski, E.F.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.