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Volumn 129-130, Issue , 1997, Pages 75-93

An historical review of surface force measurement techniques

Author keywords

Colloidal forces; DLVO forces; Surface force measurement; Van der Waals forces

Indexed keywords

ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; LUBRICATION; PHASE TRANSITIONS; RHEOLOGY; SURFACE MEASUREMENT; VAN DER WAALS FORCES;

EID: 0031592168     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(97)00029-0     Document Type: Article
Times cited : (51)

References (109)
  • 4
    • 0028447356 scopus 로고
    • and references therein
    • The radiation source provides a means by which gaseous molecules can be ionised. A small number of ions and electrons are sufficient to neutralise static charges present on the surfaces under investigation. For a recent discussion, see H. Inaba, T. Ohmi, T. Yoshida, T. Okada, J. Electrostatics, 33 (1994) 15, and references therein.
    • (1994) J. Electrostatics , vol.33 , pp. 15
    • Inaba, H.1    Ohmi, T.2    Yoshida, T.3    Okada, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.