Non-contact scanning probe microscopy with sub-piconewton force sensitivity

Ultramicroscopy

Volumn 70, Issue 1-2, 1997, Pages 45-55

  Aoki, Takaaki ^a   Hiroshima, Michio ^a   Kitamura, Kazuo ^a,b   Tokunaga, Makio ^b   Yanagida, Toshio ^a,b,c  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c OSAKA UNIVERSITY MEDICAL SCHOOL   (Japan)

Author keywords

Electrostatic interactions; Feedback control; Flexible cantilevers; Radiation pressure

Indexed keywords

COMPUTATIONAL METHODS; ELECTROSTATICS; FEEDBACK CONTROL; IONIC STRENGTH; LASER BEAM EFFECTS; MOLECULAR DYNAMICS; SILICON COMPOUNDS; SOLUTIONS; SURFACE STRUCTURE;

FLEXIBLE CANTILEVERS; INTERMOLECULAR FORCES; SCANNING PROBE MICROSCOPY;

MICROSCOPIC EXAMINATION;

GLASS; SILANE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FEEDBACK SYSTEM; FORCE; MACROMOLECULE; MOLECULAR INTERACTION; PERFORMANCE; SCANNING ELECTRON MICROSCOPY;

EID: 0031457313     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00069-7     Document Type: Article

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