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Volumn 380, Issue 2-3, 1997, Pages 224-244

Atomistic simulations of fluid structure and solvation forces in atomic force microscopy

Author keywords

Atomic force microscopy; Atomistic dynamics; Computer simulations; Molecular dynamics; Scanning tunneling microscopy; Solid liquid interfaces

Indexed keywords

ATOMS; COMPOSITION EFFECTS; COMPUTER SIMULATION; CONTINUUM MECHANICS; CRYSTAL ORIENTATION; FLUID STRUCTURE INTERACTION; MOLECULAR DYNAMICS; PARTICLE SIZE ANALYSIS; PHASE INTERFACES; SCANNING TUNNELING MICROSCOPY;

EID: 0031145049     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01397-0     Document Type: Article
Times cited : (29)

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    • note
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    • The force due to direct tip sample interactions depends upon the nature of the tip and sample materials, the dielectric properties of the fluid, and the height and shape of the tip. These factors and their implications for AFM imaging have been discussed elsewhere (F.F. Abraham, I.P. Batra and S. Ciraci, Phys. Rev. Lett. 60 (1988) 1315; I.Y. Sokolov, Surf. Sci. 311 (1994) 287). Since our interest here is primarily with the effects arising from microscopic properties of the fluid. direct tip-surface interactions lie outside the scope of the present study and have not been included.
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    • The force due to direct tip sample interactions depends upon the nature of the tip and sample materials, the dielectric properties of the fluid, and the height and shape of the tip. These factors and their implications for AFM imaging have been discussed elsewhere (F.F. Abraham, I.P. Batra and S. Ciraci, Phys. Rev. Lett. 60 (1988) 1315; I.Y. Sokolov, Surf. Sci. 311 (1994) 287). Since our interest here is primarily with the effects arising from microscopic properties of the fluid. direct tip-surface interactions lie outside the scope of the present study and have not been included.
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