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Based on simple geometric considerations, the amplitude of the force oscillations should increase linearly with R, the effective radius of curvature of the tip. R for the truncated tip is effectively four times that of the atomically-sharp tip (L.D. Gelb and R.M. Lynden Bell, Phys. Rev. B 49 (1994) 2058.
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note
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Actually, because the data in Figs. 9 and 10 represent an average over the period of the simulation, this large force is caused by a series of trapped particles rather than just one.
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This was found to be true in the system studied here using a Lennard-Jones interaction between the tip and surface, and was also observed by Xu and co-workers using a Buckingham potential. L Xu, X.-W. Yao, L.-P. Zhang, M.-Q. Li and F.-J. Yang, Phys. Rev. B 51 (1995) 10013.
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30244525916
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The force due to direct tip sample interactions depends upon the nature of the tip and sample materials, the dielectric properties of the fluid, and the height and shape of the tip. These factors and their implications for AFM imaging have been discussed elsewhere (F.F. Abraham, I.P. Batra and S. Ciraci, Phys. Rev. Lett. 60 (1988) 1315; I.Y. Sokolov, Surf. Sci. 311 (1994) 287). Since our interest here is primarily with the effects arising from microscopic properties of the fluid. direct tip-surface interactions lie outside the scope of the present study and have not been included.
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0028439236
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The force due to direct tip sample interactions depends upon the nature of the tip and sample materials, the dielectric properties of the fluid, and the height and shape of the tip. These factors and their implications for AFM imaging have been discussed elsewhere (F.F. Abraham, I.P. Batra and S. Ciraci, Phys. Rev. Lett. 60 (1988) 1315; I.Y. Sokolov, Surf. Sci. 311 (1994) 287). Since our interest here is primarily with the effects arising from microscopic properties of the fluid. direct tip-surface interactions lie outside the scope of the present study and have not been included.
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