Analysis of surface forces on oxides in aqueous solutions using AFM

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 322-326

  Arai, Toyoko ^a   Aoki, Daisuke ^a   Okabe, Yoh ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Silicon; Surface and interface states

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; ELECTROLYTES; FORCE MEASUREMENT; LOADS (FORCES); PH; PHASE INTERFACES; SILICA; SOLUTIONS; SURFACE TREATMENT; SURFACES; TIN COMPOUNDS;

CHARGE DISTRIBUTION; FORCE DISTANCE CURVES; ISOELECTRIC POINTS; SURFACE FORCES; TIN DIOXIDE;

OXIDES;

EID: 0030079866     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07005-2     Document Type: Article

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