Cantilevers and tips for atomic force microscopy

IEEE Engineering in Medicine and Biology Magazine

Volumn 16, Issue 2, 1997, Pages 28-33

  Tortonese, Marco ^a,b,c  

^a Park Scientific Instruments   (United States)

^b STANFORD UNIVERSITY   (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER; RESONANT FREQUENCY; SPRING CONSTANT; SURFACE TOPOGRAPHY; TIPS;

ATOMIC FORCE MICROSCOPY; EQUATIONS OF MOTION; MICROMACHINING; MICROSCOPES; NATURAL FREQUENCIES; SILICON; SURFACES;

MACHINE COMPONENTS;

SILICON;

ATOMIC FORCE MICROSCOPY; EQUIPMENT; MATERIALS TESTING; MECHANICS; REVIEW;

ALUMINUM; DIAMOND; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; GLASS; GOLD; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; PLASTICS; REPRODUCIBILITY OF RESULTS; SILICON; SILICON COMPOUNDS;

EID: 0031104826     PISSN: 07395175     EISSN: None     Source Type: Journal    
DOI: 10.1109/51.582173     Document Type: Review

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