Scanned probe microscope tip characterization without calibrated tip characterizers

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1518-1521

  Villarrubia, J S ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000637265     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589130     Document Type: Article

References (21)

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