A critical look at surface force measurement using a commercial atomic orce microscope in the noncontact mode

Review of Scientific Instruments

Volumn 68, Issue 11, 1997, Pages 4145-4151

  Fontaine, P ^a   Guenoun, P ^a   Daillant, J ^a  

^a SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038871278     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148359     Document Type: Article

References (19)

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18. The vibration amplitude calibration is done by contacting the surface with the tip and measuring the evolution of the raw A-B signal (signal of the dual photodiode of the deflection detection system, proportional to the deflection of the cantilever) coming from the AFM head with the extension of the Z piezo. By measuring the vibration amplitude of the electrical signal raw A-B and multiplying by the conversion coefficient, we obtained the vibration amplitude of the cantilever.
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