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Volumn , Issue , 2005, Pages 1-351

Fabrication of GaAs devices

Author keywords

Cleaning; Dry etching; Etching; Field effect transistors; GaAs; GaAs device fabrication; Gallium arsenide; Heterojunction bipolar transistors; III V semiconductors; MIS devices; MIS GaAs device; Ohmic contacts; Optoelectronic device; Optoelectronic devices; Oxidation; Passivation; Schottky barriers; Schottky contacts; Semiconductor devices; Semiconductor growth; Semiconductor properties; Surface cleaning; Wet oxidation

Indexed keywords

BIPOLAR SEMICONDUCTOR DEVICES; CLEANING; DRY ETCHING; ELECTRIC CONTACTORS; ETCHING; FIELD EFFECT SEMICONDUCTOR DEVICES; FIELD EFFECT TRANSISTORS; GALLIUM ARSENIDE; GALLIUM COMPOUNDS; HETEROJUNCTION BIPOLAR TRANSISTORS; HETEROJUNCTIONS; III-V SEMICONDUCTORS; MIS DEVICES; OHMIC CONTACTS; OPTOELECTRONIC DEVICES; OXIDATION; PASSIVATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM; SEMICONDUCTOR DEVICES; SEMICONDUCTOR GROWTH; SURFACE CLEANING; TRANSISTORS; WET ETCHING;

EID: 85013093651     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1049/PBEP006E     Document Type: Book
Times cited : (108)

References (153)
  • 62
    • 0004022087 scopus 로고    scopus 로고
    • C.I.H. Ashby [in Properties of GaAs, Eds. M.R. Brozel, G.E. Stillman (Institution of Electrical Engineers, London, 1995) ch.18, p.707-16]
    • Properties of GaAs
    • Ashby, C.I.H.1
  • 65
    • 84975375446 scopus 로고    scopus 로고
    • [Standard Guide for Development and Use of a Galvanic Series for Predicting Galvanic Corrosion Performance, ASTM Designation: G 82-83, Annual Book of ASTM Standards]
    • Annual Book of ASTM Standards
  • 70
    • 85013094690 scopus 로고
    • Eds. M.R. Brozel, G.E. Stillman (Institution of Electrical Engineers, London, ch.18
    • C.I.H. Ashby [in Properties of GaAs Eds. M.R. Brozel, G.E. Stillman (Institution of Electrical Engineers, London, 1995) ch.18, p.717-63]
    • (1995) Properties of GaAs , pp. 717-763
    • Ashby, C.I.H.1
  • 137
    • 0032203264 scopus 로고    scopus 로고
    • J.Y. Chi, K. Lu [IEEE Electron Device Lett. (USA) Vol.19 (1998) p.408]
    • (1998) , vol.19 , pp. 408
    • Chi, J.Y.1    Lu, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.