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Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1839-1855

Reliability issues in III-V compound semiconductor devices: Optical devices and GaAs-based HBTs

(1) Ueda, Osamu a

a FUJITSU LABORATORIES LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001367237 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(99)00193-6 Document Type: Review

Times cited : (41)

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