-
1
-
-
4143114928
-
Oxidation
-
S. M. Sze, Ed. New York: McGraw-Hill, ch. 4
-
E. Katz, "Oxidation," in VLSI Technology, S. M. Sze, Ed. New York: McGraw-Hill, 1983, ch. 4.
-
(1983)
VLSI Technology
-
-
Katz, E.1
-
3
-
-
0000927668
-
1-X As-GaAs quantum well heterostructures
-
1-X As-GaAs quantum well heterostructures," J. Appl. Phys., vol. 68, pp. 2235-2238, 1990.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 2235-2238
-
-
Dallesasse, J.M.1
El-Zein, N.2
Holonyak Jr., N.3
Hsieh, K.C.4
Burnham, R.D.5
Dupuis, R.D.6
-
4
-
-
0004607079
-
1-x As-AlAs-GaAs quantum well heterostructures and superlattices
-
1-x As-AlAs-GaAs quantum well heterostructures and superlattices," Appl. Phys. Lett., vol. 57, pp. 2844-2846, 1990.
-
(1990)
Appl. Phys. Lett.
, vol.57
, pp. 2844-2846
-
-
Dallesasse, J.M.1
Holonyak Jr., N.2
Sugg, A.R.3
Richard, T.A.4
Elzein, N.5
-
5
-
-
36749121824
-
Self-terminating thermal oxidation of AlAs epilayers grown on GaAs by molecular beam epitaxy
-
W. T. Tsang, "Self-terminating thermal oxidation of AlAs epilayers grown on GaAs by molecular beam epitaxy," Appl. Phys. Lett., vol. 33, pp. 426-429, 1978.
-
(1978)
Appl. Phys. Lett.
, vol.33
, pp. 426-429
-
-
Tsang, W.T.1
-
6
-
-
0000611936
-
Stability of AlAs in AlGaAs-AlAs-GaAs quantum well heterostructures
-
J. M. Dallesasse, P. Gavrilovic, N. Holonyak, Jr., R. W. Kaliski, D. W. Nam, E. J. Vesely, and R. D. Burnham, "Stability of AlAs in AlGaAs-AlAs-GaAs quantum well heterostructures," Appl. Phys. Lett., vol. 56, pp. 2436-2438, 1990.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 2436-2438
-
-
Dallesasse, J.M.1
Gavrilovic, P.2
Holonyak Jr., N.3
Kaliski, R.W.4
Nam, D.W.5
Vesely, E.J.6
Burnham, R.D.7
-
9
-
-
0012670453
-
0.5 P quantum well heterostructure window lasers (660 nm)
-
0.5 P quantum well heterostructure window lasers (660 nm)," Appl. Phys. Lett., vol. 61, pp. 1688-1690, 1992.
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 1688-1690
-
-
Maranowski, S.A.1
Kish, F.A.2
Caracci, S.J.3
Holonyak Jr., N.4
Dallesasse, J.M.5
Bour, D.P.6
Treat, D.W.7
-
10
-
-
0030085682
-
Lasing characteristics of high-performance narrow stripe InGaAs-GaAs quantum well lasers confined by AlAs native oxide
-
Y. Cheng, P. D. Dapkus, M. H. MacDougal, G. M. Yang, "Lasing characteristics of high-performance narrow stripe InGaAs-GaAs quantum well lasers confined by AlAs native oxide," IEEE Photon. Technol. Lett., vol. 8, pp. 176-178, 1996.
-
(1996)
IEEE Photon. Technol. Lett.
, vol.8
, pp. 176-178
-
-
Cheng, Y.1
Dapkus, P.D.2
MacDougal, M.H.3
Yang, G.M.4
-
11
-
-
0000883810
-
Planar native oxide index guided AlGaAs-GaAs quantum well heterostructure lasers
-
F. A. Kish, S. J. Caracci, N. Holonyak, Jr., J. M. Dallesasse, K. C. Hsieh, M. J. Ries, S. C. Smith, and R. D. Burnham, "Planar native oxide index guided AlGaAs-GaAs quantum well heterostructure lasers," Appl. Phys. Lett., vol. 59, pp. 1755-1757, 1991.
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 1755-1757
-
-
Kish, F.A.1
Caracci, S.J.2
Holonyak Jr., N.3
Dallesasse, J.M.4
Hsieh, K.C.5
Ries, M.J.6
Smith, S.C.7
Burnham, R.D.8
-
12
-
-
21544443250
-
Native oxide top and bottom confined narrow stripe p-n AlGaAs-GaAs-InGaAs quantum well heterostructure laser
-
S. A. Maranowski, A. R. Sugg, E. I. Chen, and N. Holonyak, Jr., "Native oxide top and bottom confined narrow stripe p-n AlGaAs-GaAs-InGaAs quantum well heterostructure laser," Appl. Phys. Lett., vol. 63, pp. 1660-1662, 1993.
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 1660-1662
-
-
Maranowski, S.A.1
Sugg, A.R.2
Chen, E.I.3
Holonyak Jr., N.4
-
13
-
-
0028764159
-
Native-oxide defined ring contact for low threshold vertical-cavity lasers
-
D. L. Huffaker, D. G. Deppe, K. Kumar, and T. J. Rogers, "Native-oxide defined ring contact for low threshold vertical-cavity lasers," Appl. Phys. Lett., vol. 65, pp. 97-99, 1994.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 97-99
-
-
Huffaker, D.L.1
Deppe, D.G.2
Kumar, K.3
Rogers, T.J.4
-
14
-
-
0028550787
-
Low threshold voltage vertical-cavity lasers fabricated by selective oxidation
-
K. D. Choquette, R. P. Schneider, Jr., K. L. Lear, and K. M. Geib, "Low threshold voltage vertical-cavity lasers fabricated by selective oxidation," Electron. Lett., vol. 30, pp. 2043-2044, 1994.
-
(1994)
Electron. Lett.
, vol.30
, pp. 2043-2044
-
-
Choquette, K.D.1
Schneider Jr., R.P.2
Lear, K.L.3
Geib, K.M.4
-
15
-
-
0029408684
-
Wavelength Insensitive Performance of Robust Selectively Oxidized Vertical-Cavity Lasers
-
K. D. Choquette, K. L. Lear, R. P., Schneider, Jr., K. M. Geib, J. J. Figiel, and R. Hull "Wavelength Insensitive Performance of Robust Selectively Oxidized Vertical-Cavity Lasers," Photon. Technol. Lett., vol. 7, pp. 1237-1239, 1995.
-
(1995)
Photon. Technol. Lett.
, vol.7
, pp. 1237-1239
-
-
Choquette, K.D.1
Lear, K.L.2
Schneider Jr., R.P.3
Geib, K.M.4
Figiel, J.J.5
Hull, R.6
-
16
-
-
0029304501
-
Ultralow threshold current vertical-cavity surface emitting lasers obtained with selective oxidation
-
G. M. Yang, M. H. MacDougal, and P. D. Dapkus, "Ultralow threshold current vertical-cavity surface emitting lasers obtained with selective oxidation," Electron. Lett., vol. 31, pp. 886-888, 1995.
-
(1995)
Electron. Lett.
, vol.31
, pp. 886-888
-
-
Yang, G.M.1
MacDougal, M.H.2
Dapkus, P.D.3
-
17
-
-
0029632464
-
Selectively oxidized vertical-cavity surface emitting lasers with 50% power conversion efficiency
-
K. L. Lear, K. D. Choquette, R. P. Schneider, Jr., S. P. Kilcoyne, and K. M. Geib, "Selectively oxidized vertical-cavity surface emitting lasers with 50% power conversion efficiency," Electron, Lett., vol. 31, pp. 208-209, 1995.
-
(1995)
Electron, Lett.
, vol.31
, pp. 208-209
-
-
Lear, K.L.1
Choquette, K.D.2
Schneider Jr., R.P.3
Kilcoyne, S.P.4
Geib, K.M.5
-
18
-
-
0030106607
-
High efficiency selectively oxidized MBE grown vertical-cavity surface emitting lasers
-
B. Weigl, M. Grabherr, G. Reiner, and K. J. Ebeling, "High efficiency selectively oxidized MBE grown vertical-cavity surface emitting lasers," Electron. Lett., vol. 32, pp. 557-558, 1996.
-
(1996)
Electron. Lett.
, vol.32
, pp. 557-558
-
-
Weigl, B.1
Grabherr, M.2
Reiner, G.3
Ebeling, K.J.4
-
19
-
-
0029324611
-
Cavity characteristics of selectively oxidized vertical-cavity lasers
-
K. D. Choquette, K. L. Lear, R. P. Schneider, Jr., and K. M. Geib, "Cavity characteristics of selectively oxidized vertical-cavity lasers," Appl. Phys. Lett., vol. 66, pp. 3413-3415, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 3413-3415
-
-
Choquette, K.D.1
Lear, K.L.2
Schneider Jr., R.P.3
Geib, K.M.4
-
20
-
-
0029634132
-
Lasing characteristics of low threshold microcavity lasers using half-wave spacer layers and lateral index confinement
-
D. L. Huffaker, J. Shin, and D. G. Deppe, "Lasing characteristics of low threshold microcavity lasers using half-wave spacer layers and lateral index confinement," Appl. Phys. Lett., vol. 66, pp. 1723-1725, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1723-1725
-
-
Huffaker, D.L.1
Shin, J.2
Deppe, D.G.3
-
21
-
-
36449000017
-
Modal analysis of a small surface emitting laser with a selectively oxidized waveguide
-
K. L. Lear, K. D. Choquette, R. P. Schneider, Jr., and S. P. Kilcoyne, "Modal analysis of a small surface emitting laser with a selectively oxidized waveguide," Appl. Phys. Lett., vol. 66, pp. 2616-2618, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2616-2618
-
-
Lear, K.L.1
Choquette, K.D.2
Schneider Jr., R.P.3
Kilcoyne, S.P.4
-
22
-
-
0029267483
-
Ultralow threshold current vertical-cavity surface emitting lasers with AlAs oxide-GaAs distributed Bragg reflectors
-
M. H. MacDougal, P. D. Dapkus, V. Pudikov, H. Zhao, and G. M. Yang, "Ultralow threshold current vertical-cavity surface emitting lasers with AlAs oxide-GaAs distributed Bragg reflectors," IEEE Photon. Technol. Lett., vol. 7, pp. 229-231, 1995.
-
(1995)
IEEE Photon. Technol. Lett.
, vol.7
, pp. 229-231
-
-
MacDougal, M.H.1
Dapkus, P.D.2
Pudikov, V.3
Zhao, H.4
Yang, G.M.5
-
23
-
-
0030568385
-
Huge birefringence in selectively oxidized GaAs/AlAs optical waveguides
-
A. Flore, V. Berger, E. Rosencher, N. Laurent, S. Theilmann, N. Vodjdani, and J. Nagle, "Huge birefringence in selectively oxidized GaAs/AlAs optical waveguides," Appl. Phys. Lett., vol. 68, pp. 1320-1322, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 1320-1322
-
-
Flore, A.1
Berger, V.2
Rosencher, E.3
Laurent, N.4
Theilmann, S.5
Vodjdani, N.6
Nagle, J.7
-
24
-
-
0038832279
-
Photopumped laser operation of a planar disorder and native oxide defined AlAs-GaAs photonic lattice
-
M. J. Ries, E. I. Chen, and N. Holonyak, Jr., "Photopumped laser operation of a planar disorder and native oxide defined AlAs-GaAs photonic lattice," Appl. Phys. Lett., vol. 68, pp. 2035-2037, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2035-2037
-
-
Ries, M.J.1
Chen, E.I.2
Holonyak Jr., N.3
-
25
-
-
0030194528
-
Buried refractive microlenses formed by selective oxidation of AlGaAs
-
O. Blum, K. L. Lear, H. Q. Hou, and M. E. Warren, "Buried refractive microlenses formed by selective oxidation of AlGaAs," Electron. Lett., vol. 32, pp. 1406-1408, 1996.
-
(1996)
Electron. Lett.
, vol.32
, pp. 1406-1408
-
-
Blum, O.1
Lear, K.L.2
Hou, H.Q.3
Warren, M.E.4
-
26
-
-
36449008101
-
1-xAs metal-oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs
-
1-xAs metal-oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs," Appl. Phys. Lett., vol. 66, pp. 2688-2690, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2688-2690
-
-
Chen, E.I.1
Holonyak Jr., N.2
Maranowski, S.A.3
-
27
-
-
0007614726
-
An InAlAs/InGaAs metal-oxide-semiconductor field effect transistor using the native oxide of InAlAs as the gate insulation layer
-
P. A. Grudowski, R. V. Chelakara, and R. D. Dupuis, "An InAlAs/InGaAs metal-oxide-semiconductor field effect transistor using the native oxide of InAlAs as the gate insulation layer," Appl. Phys. Lett., vol. 69, pp. 388-390, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 388-390
-
-
Grudowski, P.A.1
Chelakara, R.V.2
Dupuis, R.D.3
-
28
-
-
0030269627
-
Highly uniform and reproducible vertical cavity surface emitting lasers grown by metalorganic vapor phase epitaxy with in situ reflectometry
-
H. Q. Hou, H. C. Chui, K. D. Choquette, B. E. Hammons, W. G. Breiland, and K. M. Geib, "Highly uniform and reproducible vertical cavity surface emitting lasers grown by metalorganic vapor phase epitaxy with in situ reflectometry," IEEE Photon. Technol. Lett., vol. 8, p. 1285-1287, 1996.
-
(1996)
IEEE Photon. Technol. Lett.
, vol.8
, pp. 1285-1287
-
-
Hou, H.Q.1
Chui, H.C.2
Choquette, K.D.3
Hammons, B.E.4
Breiland, W.G.5
Geib, K.M.6
-
29
-
-
36449007360
-
Microscopic studies of semiconductor lasers utilizing a combination of transmission electron microscopy, electroluminescence imaging and focused ion beam sputtering
-
R. Hull, D. Bahnck, F. A. Stevie, L. A. Koszi, and S. N. G. Chu, "Microscopic studies of semiconductor lasers utilizing a combination of transmission electron microscopy, electroluminescence imaging and focused ion beam sputtering," Appl. Phys. Lett., vol. 62, pp. 3408-3410, 1993.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 3408-3410
-
-
Hull, R.1
Bahnck, D.2
Stevie, F.A.3
Koszi, L.A.4
Chu, S.N.G.5
-
30
-
-
0026960815
-
1-x native oxides in heterostructure lasers
-
1-x native oxides in heterostructure lasers," J. Electron. Mater., vol. 21, pp. 1133-1139, 1992.
-
(1992)
J. Electron. Mater.
, vol.21
, pp. 1133-1139
-
-
Kish, F.A.1
Caracci, S.J.2
Holonyak Jr., N.3
Hsieh, K.C.4
Baker, J.E.5
Maranowski, S.A.6
Sugg, A.R.7
Dallesasse, J.M.8
Fletcher, R.M.9
Kuo, C.P.10
Osentowski, T.D.11
Craford, M.G.12
-
31
-
-
0040705098
-
1-x As
-
VerticalCavity Surface Emitting Lasers, K. D. Choquette and D. G. Deppe, Eds.
-
1-x As," in VerticalCavity Surface Emitting Lasers, K. D. Choquette and D. G. Deppe, Eds., Proc. SPIE, vol. 3003, pp. 55-61, 1997.
-
(1997)
Proc. SPIE
, vol.3003
, pp. 55-61
-
-
Twesten, R.D.1
Follstaedt, D.M.2
Choquette, K.D.3
-
32
-
-
0000573767
-
1-xAs: Temporal evolution of composition and microstructure and the implications for metal-insulator-semiconductor applications
-
1-xAs: temporal evolution of composition and microstructure and the implications for metal-insulator-semiconductor applications," Appl. Phys. Lett., vol. 70, pp. 2443-2445, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2443-2445
-
-
Ashby, C.I.H.1
Sullivan, J.P.2
Newcomer, P.P.3
Missert, N.A.4
Hou, H.Q.5
Hammons, B.E.6
Hafich, M.J.7
Baca, A.C.8
-
33
-
-
0001449315
-
Wet oxidation of AlGaAs: The role of hydrogen
-
C. I. H. Ashby, J. P. Sullivan, K. D. Choquette, K. M. Geib, and H. Q. Hou, "Wet oxidation of AlGaAs: The role of hydrogen," J. Appl. Phys., 1997.
-
(1997)
J. Appl. Phys.
-
-
Ashby, C.I.H.1
Sullivan, J.P.2
Choquette, K.D.3
Geib, K.M.4
Hou, H.Q.5
-
35
-
-
0347229462
-
Structure of III-V oxides
-
G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael, and N. J. Zaluec, Eds. San Francisco, CA: San Francisco Press
-
Z. Liliental-Weber, M. Li, G. S. Li, C. Chang-Hasnain, and E. R. Weber, "Structure of III-V oxides," in Proc. Microscopy and Microanalysis, G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael, and N. J. Zaluec, Eds. San Francisco, CA: San Francisco Press, 1996, pp. 942-943.
-
(1996)
Proc. Microscopy and Microanalysis
, pp. 942-943
-
-
Liliental-Weber, Z.1
Li, M.2
Li, G.S.3
Chang-Hasnain, C.4
Weber, E.R.5
-
36
-
-
0001529006
-
Microstructure of AIGaAs-oxide heterolayers formed by wet oxidation
-
S. Guha, F. Agahi, B. Pezeshki, J. A. Kash, D. W. Kisker, and N A. Bojarczuk, "Microstructure of AIGaAs-oxide heterolayers formed by wet oxidation," Appl. Phys. Lett., vol. 68, pp. 906-909, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 906-909
-
-
Guha, S.1
Agahi, F.2
Pezeshki, B.3
Kash, J.A.4
Kisker, D.W.5
Bojarczuk, N.A.6
-
37
-
-
0000377928
-
1-xAs layers in verticalcavity lasers
-
1-xAs layers in verticalcavity lasers," Appl. Phys. Lett., vol. 69, pp. 19-21, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 19-21
-
-
Twesten, R.D.1
Follstaedt, D.M.2
Choquctte, K.D.3
Schneider Jr., R.P.4
-
38
-
-
0000971304
-
Interface structure of selectively oxidized AlAs/GaAs
-
T. Tukamori, K. Takemasa, and T. Kamijoh, "Interface structure of selectively oxidized AlAs/GaAs," Appl. Phys. Lett., vol. 69, pp. 659-661, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 659-661
-
-
Tukamori, T.1
Takemasa, K.2
Kamijoh, T.3
-
39
-
-
0028767530
-
Wide bandwidth distributed Bragg reflectors using oxide/GaAs multilayers
-
M. H. MacDougal, H. Zhao, P. D. Dapkus, M. Ziari, and W. H. Stcier, "Wide bandwidth distributed Bragg reflectors using oxide/GaAs multilayers," Electron. Lett., vol. 30, pp. 1147-1149, 1994.
-
(1994)
Electron. Lett.
, vol.30
, pp. 1147-1149
-
-
MacDougal, M.H.1
Zhao, H.2
Dapkus, P.D.3
Ziari, M.4
Stcier, W.H.5
-
40
-
-
0001520150
-
Selective oxidation of buried AlGaAs versus AlAs layers
-
K. D. Choquette, K. M. Geib, H. C. Chui, B. E. Hammons, H. Q. Hou, T. J. Drummond, and R. Hull, "Selective oxidation of buried AlGaAs versus AlAs layers," Appl. Phys. Lett., vol. 69, pp. 1385-1387, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1385-1387
-
-
Choquette, K.D.1
Geib, K.M.2
Chui, H.C.3
Hammons, B.E.4
Hou, H.Q.5
Drummond, T.J.6
Hull, R.7
-
41
-
-
0031373538
-
Fabrication issues of oxide-confined VCSEL's
-
Vertical-Cavity Surface Emitting Lasers, K. D. Choquette and D. Deppe, Eds.
-
K. M. Geib, K. D. Choquette, H. Q. Hou, and B. E. Hammons, "Fabrication issues of oxide-confined VCSEL's," in Vertical-Cavity Surface Emitting Lasers, K. D. Choquette and D. Deppe, Eds., Proc. SPIE, 1997, vol. 3003, pp. 69-74.
-
(1997)
Proc. SPIE
, vol.3003
, pp. 69-74
-
-
Geib, K.M.1
Choquette, K.D.2
Hou, H.Q.3
Hammons, B.E.4
-
42
-
-
0030370353
-
Selective oxidation of buried AlGaAs for fabrication of vertical-cavity lasers
-
K. D. Choquette, K. M. Geib, H. C. Chui, H. Q. Hou, and R. Hull, "Selective oxidation of buried AlGaAs for fabrication of vertical-cavity lasers," Materials Res. Soc. Proc., vol. 421, pp. 53-61, 1996.
-
(1996)
Materials Res. Soc. Proc.
, vol.421
, pp. 53-61
-
-
Choquette, K.D.1
Geib, K.M.2
Chui, H.C.3
Hou, H.Q.4
Hull, R.5
-
44
-
-
0001372432
-
1-x As layers
-
1-x As layers," J. Appl. Phys., vol. 78, pp. 5201-5203, 1995.
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 5201-5203
-
-
Nickel, H.1
-
45
-
-
1642621158
-
General relationship for the thermal oxidation of silicon
-
B. E. Deal and A. S. Grove, "General relationship for the thermal oxidation of silicon," J. Appl. Phys., vol. 36, p. 3770, 1965.
-
(1965)
J. Appl. Phys.
, vol.36
, pp. 3770
-
-
Deal, B.E.1
Grove, A.S.2
-
46
-
-
0004558206
-
1-xAs
-
1-xAs," Appl. Phys. Lett., vol. 60, pp. 3165-3167, 1992.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 3165-3167
-
-
Kish, F.A.1
Maranowski, S.A.2
Hofler, G.E.3
Holonyak Jr., N.4
Caracci, S.J.5
Dallesasse, J.M.6
Hsieh, K.C.7
-
47
-
-
0030127779
-
Kinetics of thermal oxidation of AlAs in water vapor
-
M. Ochiai, G. E. Giudice, H. Temkin, J. W. Scott, and T. M. Cockerill, "Kinetics of thermal oxidation of AlAs in water vapor," Appl. Phys. Lett., vol. 68, pp. 1898-1890, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 1898-11890
-
-
Ochiai, M.1
Giudice, G.E.2
Temkin, H.3
Scott, J.W.4
Cockerill, T.M.5
-
48
-
-
0001602772
-
1-x As-GaAs depending on its structure
-
1-x As-GaAs depending on its structure," Appl. Phys. Lett., vol. 69, pp. 3357-3359, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 3357-3359
-
-
Kim, J.H.1
Lim, D.H.2
Kim, K.S.3
Yang, G.M.4
Lim, K.Y.5
Lee, H.J.6
-
49
-
-
0000723266
-
Surface energy model for the thickness dependence of the lateral oxidation of AlAs
-
R. L. Naone and L. A. Coldren, "Surface energy model for the thickness dependence of the lateral oxidation of AlAs," J. Appl. Phys., 1997.
-
(1997)
J. Appl. Phys.
-
-
Naone, R.L.1
Coldren, L.A.2
-
50
-
-
0006633729
-
Barrier layer thickness control of selective wet oxidation of AlGaAs for embedded optical elements
-
O. Blum, C. I. H. Ashby, and H. Q. Hou, "Barrier layer thickness control of selective wet oxidation of AlGaAs for embedded optical elements," Appl. Phys. Lett., vol. 70, pp. 2870-2872, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2870-2872
-
-
Blum, O.1
Ashby, C.I.H.2
Hou, H.Q.3
-
51
-
-
0031076450
-
Oxidation of AlGaAs layers for tapered apertures in vertical cavity lasers
-
R. L. Naone, E. R. Hegbloom, B. J. Thibeault, and L. A. Coldren, "Oxidation of AlGaAs layers for tapered apertures in vertical cavity lasers," Electron. Lett., vol. 33, pp. 300-301, 1997.
-
(1997)
Electron. Lett.
, vol.33
, pp. 300-301
-
-
Naone, R.L.1
Hegbloom, E.R.2
Thibeault, B.J.3
Coldren, L.A.4
-
52
-
-
0020156657
-
Orientation dependence of oxygen absorption on a cylindrical GaAs crystal
-
W. Ranke, Y. R. Xing, and G. D. Shen, "Orientation dependence of oxygen absorption on a cylindrical GaAs crystal," J. Vac. Sci. Technol., vol. 21, pp. 426-428, 1982.
-
(1982)
J. Vac. Sci. Technol.
, vol.21
, pp. 426-428
-
-
Ranke, W.1
Xing, Y.R.2
Shen, G.D.3
-
53
-
-
0028549879
-
Low threshold half-wave vertical cavity lasers
-
D. L Huffaker, J. Shin, and D. G. Deppe, "Low threshold half-wave vertical cavity lasers," Electron. Lett., vol. 30, pp. 1946-1947, 1994.
-
(1994)
Electron. Lett.
, vol.30
, pp. 1946-1947
-
-
Huffaker, D.L.1
Shin, J.2
Deppe, D.G.3
-
54
-
-
0001607855
-
Life testing oxide confined VCSELs: Too good to last?
-
Fabrication, Testing, and Reliability of Semiconductor Lasers, M. Fallahi and S. C. Wang, Eds.
-
K. L. Lear, S. P. Kilcoyne, R. P. Schneider, Jr., and J. A. Nevers, "Life testing oxide confined VCSELs: Too good to last?" in Fabrication, Testing, and Reliability of Semiconductor Lasers, M. Fallahi and S. C. Wang, Eds., Proc. SPIE, 1996, vol. 2683, pp. 114-122.
-
(1996)
Proc. SPIE
, vol.2683
, pp. 114-122
-
-
Lear, K.L.1
Kilcoyne, S.P.2
Schneider Jr., R.P.3
Nevers, J.A.4
-
55
-
-
85064142864
-
Reliability of proton-implanted VCSEL's for data communications
-
Fabrication, Testing, and Reliability of Semiconductor Lasers, M. Fallahi and S. C. Wang, Eds.
-
J. K. Guenter, R. A. Hawthorne, D. N. Granville, M. K. Hibbs-Brenner, and R. A. Morgan, "Reliability of proton-implanted VCSEL's for data communications," in Fabrication, Testing, and Reliability of Semiconductor Lasers, M. Fallahi and S. C. Wang, Eds., Proc. SPIE, 1996, vol. 2683, pp. 102-103.
-
(1996)
Proc. SPIE
, vol.2683
, pp. 102-103
-
-
Guenter, J.K.1
Hawthorne, R.A.2
Granville, D.N.3
Hibbs-Brenner, M.K.4
Morgan, R.A.5
|