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Volumn 28, Issue 25, 2016, Pages 5106-5111

Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Author keywords

carrier diffusion; carrier dynamics; InGaN; nanowires; real space imaging; surface dynamics; ultrafast electron microscopy

Indexed keywords

CADMIUM COMPOUNDS; CHARGE CARRIERS; DIFFUSION; DYNAMICS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; ENERGY DISSIPATION; GALLIUM ALLOYS; II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; INDIUM ALLOYS; LASER SPECTROSCOPY; NANOWIRES; OPTOELECTRONIC DEVICES; SELENIUM COMPOUNDS; SEMICONDUCTOR ALLOYS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; TIME DELAY; URANIUM METALLOGRAPHY; VISUALIZATION;

EID: 84977137958     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201600202     Document Type: Article
Times cited : (31)

References (60)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.