Visualization of carrier dynamics in p(n)-type GaAs by scanning ultrafast electron microscopy

Proceedings of the National Academy of Sciences of the United States of America

Volumn 111, Issue 6, 2014, Pages 2094-2099

  Cho, Jongweon ^a   Hwang, Taek Yong ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Charge dynamics imaging; Scanning electron microscopy; Ultrafast phenomena

Indexed keywords

EID: 84893834818     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1400138111     Document Type: Article

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